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Description

HAR1-200A-1042N m, 320kHz, Asymmetric Tip, Al Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Tilt Compensated High Aspect Ratio (5: 1) Focused Ion Beam (FIB) probes for high resolution TappingMode imaging on samples with tall deep geometries. Specifications: 42 N m, 320 kHz, 10 nm radius, Al reflex coating. 10 probes per pack. Compatible with most commercially available AFMs. High aspect ratio probe based upon Bruker technology

10-Pack DESCRIPTION

MLCT-BIO-DC is a low thermal sensitivity version of the probe that is available for heated applications that can cause probe bending or drift

5 Front Angle: 35 ± 2 Back Angle: 35 ± 2 Side Angle: 35 ± 2 Tip Radius (Nom): 20 Tip Radius (Max): 60 Tip Set Back (Nom): 4

5 Tip Radius (Nom): 100 Tip Radius (Max): 150 Tip Coating: Conductive Diamond Tip Set Back (Nom): 14 Tip Set Back( RNG): 11 - 16

Bruker also offers solid diamond probes with pyramidal tips

The Pt-Ir coating on the front side of the cantileverprovides a metallic electrical path from the cantilever die to the apexof the tip

Round Re-Entrant Tips for 3-D imaging

The very high low nominal 40N/m spring constant is most suitable for very stiff (typically >> 1 GPa) samples

suitable for higher force and harder sample applications including:

25N/m nominal

the MESP-RC-V2's hard Cobalt-Chromium coating is tailored for high-sensitivity and magnetic contrast

This Bruker SurfaceTopography Reference Dies have a variety of step heights and pitches fordaily monitoring of SPM performance