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Description

Tap190GD-GGold Coated Tapping Mode AFM Probe with Long Cantilever DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Gold Coated Tapping Mode AFM Probe with Long Cantilever Monolithic silicon AFM probe for high frequency non contact and tapping mode operation. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM

Pyrolytic Graphite (PG) is a unique form of graphite manufactured by decomposition of a hydrocarbon gas at very high temperature in a vacuum furnace

Tip Geometry: Critical Dimension (Overhang) Tip Height: 10 - 15 Tip Radius (Max): <10 Tip Set Back (Nom): 15 Tip Set Back( RNG): 5 - 25 Tilt Compensation: 3

and Silicon Monoxide are available on the following 3

16074 MSDS (33KB PDF)

Ø32 x 10mm x M4

100: Pitch 254µm

Width x Thickness 5797 PELCO® Pro Wafer Tweezers

Ultramicroscopy

657-400-AU-100 - Quantifoil®

Bruker Atomic Force Microscopy group also provides many other nano-electrical probes and modes for AFM based electrical measurements including the unique PeakForce KPFM and PeakForce TUNA modes

The widely used gold on carbon test specimens are excellent for SEM

PELCO® AFM Gold Standard Kit

Exchange/Return Notes